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| 1983 | Validation study: Patent citations as indicators of science and foreign dependence
RePEc:eee:worpat:v:5:y:1983:i:3:p:180-185 [Citation Analysis] | 9 |
| 1981 | Citation rates to technologically important patents
RePEc:eee:worpat:v:3:y:1981:i:4:p:160-163 [Citation Analysis] | 7 |
| 2003 | Historical perspectives on IP protection for software in selected countries worldwide
RePEc:eee:worpat:v:25:y:2003:i:1:p:19-25 [Citation Analysis] | 7 |
| 2000 | The referencing of prior art documents in European patents and applications
RePEc:eee:worpat:v:22:y:2000:i:4:p:309-315 [Citation Analysis] | 4 |
| 2003 | Determinants of foreign patents in China
RePEc:eee:worpat:v:25:y:2003:i:1:p:27-37 [Citation Analysis] | 3 |
| 2007 | The rigour of EPOs patentability criteria: An insight into the induced withdrawals
RePEc:eee:worpat:v:29:y:2007:i:4:p:317-326 [Citation Analysis] | 3 |
| 2005 | Cross comparison of US, EU, JP and Korean companies patenting activity in Japan and in the Peoples Republic of China
RePEc:eee:worpat:v:27:y:2005:i:2:p:125-134 [Citation Analysis] | 2 |
| 2005 | Independent inventors and public support measures: insights from 33 case studies in Finland
RePEc:eee:worpat:v:27:y:2005:i:2:p:113-123 [Citation Analysis] | 2 |
| 1982 | The office of technology assessment and forecast industry concordance as a means of identifying industry technology origins
RePEc:eee:worpat:v:4:y:1982:i:1:p:12-17 [Citation Analysis] | 2 |
| 2006 | Patent filing and searching: Is deflation in quality the inevitable consequence of hyperinflation in quantity?
RePEc:eee:worpat:v:28:y:2006:i:2:p:117-121 [Citation Analysis] | 2 |
| 1983 | Patent statistics as a measure of technological vitality
RePEc:eee:worpat:v:5:y:1983:i:3:p:170-173 [Citation Analysis] | 1 |
| 2003 | Patinformatics: Tasks to tools
RePEc:eee:worpat:v:25:y:2003:i:3:p:211-221 [Citation Analysis] | 1 |
| 2008 | Patent inflation in Europe
RePEc:eee:worpat:v:30:y:2008:i:1:p:43-52 [Citation Analysis] | 1 |
| 2000 | Carbon nanotubes: bibliometric analysis of patents
RePEc:eee:worpat:v:22:y:2000:i:3:p:185-189 [Citation Analysis] | 1 |
| 1999 | The European Patent System: an introduction for patent searchers
RePEc:eee:worpat:v:21:y:1999:i:3:p:135-163 [Citation Analysis] | 1 |
| 2003 | The future of prior art searching at the United States patent and trademark office
RePEc:eee:worpat:v:25:y:2003:i:4:p:283-287 [Citation Analysis] | 1 |
| 2006 | Mapping nanotechnology patents: The EPO approach
RePEc:eee:worpat:v:28:y:2006:i:3:p:204-211 [Citation Analysis] | 1 |
| 2003 | Patent information for strategic technology management
RePEc:eee:worpat:v:25:y:2003:i:3:p:233-242 [Citation Analysis] | 1 |
| 2011 | Patent backlogs at USPTO and EPO: Systemic failure vs deliberate delays
RePEc:eee:worpat:v:33:y:2011:i:2:p:122-127 [Citation Analysis] | 1 |
| 2002 | The electric vehicle:: Patent data as indicators of technological development
RePEc:eee:worpat:v:24:y:2002:i:1:p:5-12 [Citation Analysis] | 1 |
| 2003 | Free patent information as a resource for policy analysis
RePEc:eee:worpat:v:25:y:2003:i:3:p:223-231 [Citation Analysis] | 1 |
| 2011 | Europe should stop taxing innovation
RePEc:eee:worpat:v:33:y:2011:i:1:p:16-22 [Citation Analysis] | 1 |
Warning!! This is still an experimental service. The results of this service should be interpreted with care, especially in research assessment exercises. The processing of documents is automatic. There still are errors and omissions in the identification of references. We are working to improve the software to increase the accuracy of the results.
Source data used to compute the impact factor of RePEc series.
